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Yamaki, Kenichi*; Kita, Satoshi*; Obayashi, Hironari; Ariyoshi, Gen; Saito, Shigeru; Sasa, Toshinobu
JAEA-Technology 2020-021, 26 Pages, 2021/02
JAEA-Technology-2020-021.pdf:2.34MB
As digitalization of measuring instruments, Programmable Logic Controller is mainly used for controlling large-scale devices, and many test devices are controlled in digital. Together with increase of the data storage capacity, it has become possible to record the measured values over the entire experimental period. By collecting the entire experimental data, it became easy to appropriately record the test environment during the corrosion test of materials and to analyze the changes and transients during continuous operation from various viewpoints. On the other hand, in a long-term test, the large number of measurement data were recorded, which requires long time for data processing and data extraction for analyses. In addition, it is necessary to pay attention to organize the data collected by different data formats. To solve these problems, a processing tool were produced to extract and process the data efficiently from the sequencer installed in the lead-bismuth test device.
Toyama, Shigeyuki*; Wakamatsu, Hisanori; Okazaki, Hikoya
JNC TJ7440 2000-019, 17 Pages, 2000/03
JNC-TJ7440-2000-019.pdf:1.95MB
no abstracts in English
Toyama, Shigeyuki*; Wakamatsu, Hisanori; Okazaki, Hikoya
JNC TJ7440 2000-018, 55 Pages, 2000/03
JNC-TJ7440-2000-018.pdf:9.57MB
no abstracts in English